The switchover requires no adjustments, making it easy to measure the same areas or points with both the Cr Kα and the Al Kα.ĭual Beam Source for Easy Measurement of the Same Spot Enhanced SmartSoft-XPS can control the X-ray anode position and the motorized mechanical shutter, which allows rapid switching between the Cr Kα and the Al Kα. Expanding Extensive Applications Using Two Different Energy X-raysĭual Scanning X-ray Photoelectron Microprobe Equipped with Hard X-Ray Dual Scanning Monochromatic X-ray SourceĮquipped with a dual scanning X-ray source composed of the monochromatic Cr Kα (5.4 keV) and Al Kα (1.5 keV), the PHI Quantes is capable of obtaining secondary electron images (SXI) by scanning X-ray beam over the sample, which precisely allows to identify areas and/or points where you want to analyze.Dual Scanning X-ray Photoelectron Microprobe Equipped with Hard X-Ray.

The PHI Quantes is an XPS instrument designed to pioneer new methods and applications transcending conventional ideas of what is possible. The PHI Quantes inherits the core technologies of the PHI Quantera II, which ensure the availability of the superior features such as automatic analysis, automatic sample transfer, turnkey charge neutralization, and advanced data processing. The two different types of X-ray sources can be switched automatically, allowing users to analyze the same area and/or points of a sample. This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. The PHI Quantes is equipped with a dual scanning X-ray source composed of a hard X-ray source (Cr Kα) and a conventional soft X-ray source (Al Kα), which have different energy values.

Al xps peak al-ch